Our research is aimed at obtaining new materials or materials with improved properties of interest in different fields of activity. We approach this process in two ways, i.e. starting from a desired property we design the composition and structure of the material, or conversely from a given structure we adjust the properties.
Obtaining supramolecular systems
Researcher: Ioana-Georgeta Grosu
Supramolecular systems are new materials of interest for many industrial branches and have particular impact in the pharmaceutical, food supplements, cosmetics, chemical (pesticides) industries. The incorporation of substances of interest into various carrier matrices, resulting in the formation of supramolecular systems, aims to improve some of their physico-chemical properties…
Nanoimprint lithography
Researcher: Alia Colniță
Nanoimprint Lithography (NIL – Nanoimprint Lithography) is a modern, high-resolution technique with high-throughput for the fabrication of high quality and orderedmicro/nanostructured surfaces down to 10 nm in size. To fabricate various micro/nanostructured patterns on the surfaces, customized molds are used, which have to be designed in advance and usually are made out of rigid materials (e.g. silicon or chromium)…
Epitaxial film deposition by MBE
Researcher: Radu Tiberiu Brătfălean
Ultra-high vacuum epitaxial film deposition by MBE (Molecular Beam Epitaxy) technique is a fabrication technology by which a film, from a material of interest, can be grown on a deposition substrate. The substrate is chosen both to favor the single crystal structure of the film and to provide the necessary adhesion. The deposition of the film is…
Thin film deposition by pulsed laser ablation
Researcher: Daniel Marconi
Thin films are structures that have one dimension much smaller than the other two (10 nm ÷ 100 nm). They are intensively used because of the properties that nanostructuring confers: enhanced charge transport, increased toughness and, in the case of semiconductor thin films, enhanced charge carrier motion in the plane of the thin film compared to the plane perpendicular to the film…